CONTROL 2010, May 4th to 7th, 2010

Please visit us on the CONTROL exhibition May, 4th to 7th.
You’ll find our booth 3008 in hall 3.

NEW PRODUCTS

MultiScan AFM 3000 Atomic Force Microscope

Please have a look at our new Scanning Atomic Force Microscope. Only our instrument provides the patented Chemical Contrast Imaging mode which specifically is used to interpret material related profile data. AFM with the world-wide largest scanning range.

Roughness measurement

• MicroProfiler: world-wide smallest roughness measuring instrument with entirely new application areas and substantial reduction of your quality insurance cost
• Styco: stylus control instrument to check the diamond stylus of roughness pick ups.