Short Coherence Interferometers

Common features:

• Non-contact, fast and accurate area measurement of the surface topography
• Data evaluation using the most advanced and application specific mathematics

WLI Lab (Mirau)

This flexible and universal instrument comes with an objective turret and can be supplied with several objectives of different magnification. The maximum field of view is approx. 1 mm². It is a fast measuring instrument, robust and maintenance free and is used in both the research and production environment. Typical measurement applications are the quantitative measurement of surface features, roughness, wear, step heights, micro structure in the micrometer range.


WLI Linnik

This instrument type offers both a vertical and lateral resolution upto the limits of physics. Therefore it lends itself specifically for the investigation of very smooth surfaces and their roughness.

WLI LA (Michelson)

This instrument is specifically for the surface topography measurement of large areas (up to 150 mm²) offering an optimal trade off between measurement area and aperture. This results in the best possible measurement of tilted surfaces (both microscopic and macroscopic).


WLI VLA (Michelson)

This interferometer was specifically designed for the measurement of objects with a diameter of up to 50 mm without stitching. The instrument is robust and simple to operate. It is used for the fast measurement of flatness, step heights, and waviness.




White light interferometers for specific applications


WLI Ring

This portable instrument is used to measure the surface topography and structure on both printing rollers and sheet metal rollers as well as flat surfaces. Apart from the measurement of roughness and microstructure the geometry of printing cups (area, depth, volume) can be determined.

 

WLI Lab	WLI Linnik	WLI LA